JPH0224444B2 - - Google Patents

Info

Publication number
JPH0224444B2
JPH0224444B2 JP58163703A JP16370383A JPH0224444B2 JP H0224444 B2 JPH0224444 B2 JP H0224444B2 JP 58163703 A JP58163703 A JP 58163703A JP 16370383 A JP16370383 A JP 16370383A JP H0224444 B2 JPH0224444 B2 JP H0224444B2
Authority
JP
Japan
Prior art keywords
correction amount
output
gauge
circuit
amount calculation
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP58163703A
Other languages
English (en)
Japanese (ja)
Other versions
JPS6055221A (ja
Inventor
Kazuo Ume
Kazuo Himizu
Keiji Fujita
Masaji Hatsutori
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Anritsu Corp
Original Assignee
Anritsu Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Anritsu Corp filed Critical Anritsu Corp
Priority to JP16370383A priority Critical patent/JPS6055221A/ja
Publication of JPS6055221A publication Critical patent/JPS6055221A/ja
Publication of JPH0224444B2 publication Critical patent/JPH0224444B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B21/00Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
    • G01B21/02Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness
    • G01B21/08Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness for measuring thickness

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)
JP16370383A 1983-09-06 1983-09-06 走間厚み計 Granted JPS6055221A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP16370383A JPS6055221A (ja) 1983-09-06 1983-09-06 走間厚み計

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP16370383A JPS6055221A (ja) 1983-09-06 1983-09-06 走間厚み計

Publications (2)

Publication Number Publication Date
JPS6055221A JPS6055221A (ja) 1985-03-30
JPH0224444B2 true JPH0224444B2 (en]) 1990-05-29

Family

ID=15779012

Family Applications (1)

Application Number Title Priority Date Filing Date
JP16370383A Granted JPS6055221A (ja) 1983-09-06 1983-09-06 走間厚み計

Country Status (1)

Country Link
JP (1) JPS6055221A (en])

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0461845U (en]) * 1990-10-04 1992-05-27

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0353122Y2 (en]) * 1985-02-25 1991-11-20
JPS61254812A (ja) * 1985-05-08 1986-11-12 Meisan Kk 非磁性体シ−ト厚さ連続測定装置
US5070227A (en) * 1990-04-24 1991-12-03 Hypertherm, Inc. Proceses and apparatus for reducing electrode wear in a plasma arc torch
JPH08215856A (ja) * 1995-02-13 1996-08-27 Komatsu Sanki Kk プラズマ切断方法
US6677551B2 (en) 1998-10-23 2004-01-13 Innerlogic, Inc. Process for operating a plasma arc torch
US9949356B2 (en) 2012-07-11 2018-04-17 Lincoln Global, Inc. Electrode for a plasma arc cutting torch

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS522452A (en) * 1975-06-24 1977-01-10 Nippon Kokan Kk <Nkk> Method and apparatus for measuring plate thickness
JPS533261A (en) * 1976-06-29 1978-01-12 Fuji Electric Co Ltd Magnetic sheet thickness detecting device
JPS5659609U (en]) * 1979-10-16 1981-05-21

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0461845U (en]) * 1990-10-04 1992-05-27

Also Published As

Publication number Publication date
JPS6055221A (ja) 1985-03-30

Similar Documents

Publication Publication Date Title
JP2004177154A (ja) 回転角度検出装置
JPH0224444B2 (en])
JPS6227884B2 (en])
US6606534B1 (en) Strip thickness control apparatus for rolling mill
JP2801124B2 (ja) トルクセンサの零点誤差の補正方法
JP2803966B2 (ja) トルクセンサの零点誤差の補正方法
JPH06182443A (ja) バックアップロールの偏心量検出方法およびそのロール偏心除去方法
JP2803967B2 (ja) トルクセンサの零点誤差の補正方法
JP3328908B2 (ja) 圧延機のロール偏心制御装置
JPH02115739A (ja) タイヤ転がり抵抗測定値の補正方法
JP2791170B2 (ja) 圧延制御装置
JPH0479942B2 (en])
JPH0989545A (ja) スリッタラインの板材の測長装置
JP2740119B2 (ja) 圧延材の形状検出方法及び同検出装置
JPS58313A (ja) シ−ムレスパイプ圧延機の制御方法
JPS62100602A (ja) ベアリングギヤツプセンサ−
JPH0522328Y2 (en])
JP2519344B2 (ja) 加工精度測定装置
JPS60228911A (ja) 厚み計の自動硬度補正装置
JPH10246738A (ja) 周波数変化量検出装置
SU770588A1 (ru) Способ устранения влияния эксцентриситета опорных валков и устройство для его осуществления 1
JPH0566204B2 (en])
SU710700A1 (ru) Устройство управлени прокатным станом дл компенсации температурного расширени диаметра валков
JPH06304622A (ja) 熱延仕上圧延機のレベリング設定のためのロールプロフィル予測方法及びその設定方法
JPH10260113A (ja) 車両の車輪回転制動力検査装置